Effect of Post Annealing Temperature on Cerium Doped ZnO Nanostructures

Chetan Kasar; Ulhas S. Sonawane; D.S. Patil

doi:10.4028/www.scientific.net/AMM.481.45

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 481Effect of Post Annealing Temperature on Cerium...

Effect of Post Annealing Temperature on Cerium Doped ZnO Nanostructures

Abstract:

In this paper, the effect of post annealing temperature for 5% Cerium doped ZnO thin films have been investigated. Films have been deposited on to the glass substrate using spin coating method. The structural and optical properties of the films were characterized using X-ray diffractometer and UV-spectrophotometer. Transmission of the films was found to be increase with increasing post annealing temperature. Average transmission of all the films was found to be more than 90%. Optical band gap show a minor variation with post annealing temperature. Nanostructures of cerium doped ZnO have been confirmed through AFM.

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Periodical:

Applied Mechanics and Materials (Volume 481)

Pages:

45-48

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.481.45

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Online since:

December 2013

Authors:

Chetan Kasar*, Ulhas S. Sonawane, D.S. Patil

Keywords:

Ce-ZnO Thin Film, Nanostructure, Spin Coating

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