State of Charge Estimation of Lithium-Ion Battery Using Extended Kalman Filter Based on a Comprehensive Model

Article Preview

Abstract:

The state of charge (SOC) is an important index for power battery system. To obtain its accurate value,a comprehensive equivalent circuit model that parameters change depend on SOC was estiblished in this paper by using the lithium-ion battery hybrid pulse power characteristic data. Then the Extended Kalman filter (EKF) method is applied to estimate the SOC under the working condition. Numerical simulations are conducted to verify the effectiveness of the model and the EKF method. The results show that the EKF method based on the dynamic model can satisfy the accuray requirements.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

999-1002

Citation:

Online since:

January 2014

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2014 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] M. Chen, and G. A. Rincon-Mora: IEEE Trans. on Energy Conversion, vol. 21, no. 2(2006), p.504–511.

Google Scholar

[2] K. Smith, C. D. Rahn and C-Y: IEEE Transactions on Control Systems Technology, Vol. 18, no. 3(2010), p.654–663.

Google Scholar

[3] B. S Bhangu, P. Bentley, D.A. Stone, and C.M. Bingham: IEEE Trans. Veh. Tech. vol. 54(2005), p.783–794.

Google Scholar

[4] H. Dai, X. Wei, and Z. Sun: Appl. Energy, vol. 95(2012), p.227–237.

Google Scholar

[5] M. Charkhgard and M. Farrokhi: IEEE Transactions on Industrial Electronics, vol. 57, no. 12(2010).

Google Scholar

[6] C. R. Gould, C. M. Bingham, D. A. Stone, and P. Bently: IEEE Trans. Veh. Technol., vol. 58, no. 8(2009), p.3905–3916.

Google Scholar

[7] N. Watrin, R. Roche, H. Ostermann, B. Blunier, and A. Miraoui: IEEE Trans. Veh. Technol, vol. 61, no. 8( 2012), p.3420–3429.

DOI: 10.1109/tvt.2012.2205169

Google Scholar

[8] M. Charkhgard and M. Farrokhi: IEEE Transactions on Industrial Electronics, vol. 57, no. 12(2010).

Google Scholar

[9] Simon J. Julier and Jeffrey K. Uhlmann: Proceedings of the IEEE, Vol. 92, no. 3(2004), pp.401-422.

Google Scholar