Impacts of Solder Voids on Power Devices' Thermal Characteristics

Article Preview

Abstract:

Thermal performance is very important to power devices. Solder voids are detrimental to power devices thermal and reliability characteristics. According to above-mentioned problem, using computer software as an analysis tool, making some simulation and modeling on the influence of different solder voids distribution to power devices thermal characteristics. Focus on the solder voids around active region of power devices. Computing results show that solder voids under active region are the most evidently factor to power devices thermal characteristics and provide some suggests on the process of power devices thermal design.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

70-74

Citation:

Online since:

February 2014

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2014 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] Victor A. Chiriac and Youmin Yu: Impacts of Solder Voids on PQFN Packages' Thermal and Mechanical Performances (2010).

DOI: 10.1109/itherm.2010.5501269

Google Scholar

[2] Kenny C. Otiaba, R.S. Bhatti, N.N. Ekere, S. Mallik, M.O. Alam, E.H. Amalu, M. Ekpu: Numerical study on thermal impacts of different void patterns on performance of chip-scale packaged power device, Microelectronics Reliability 52 (2012).

DOI: 10.1016/j.microrel.2012.01.015

Google Scholar

[3] Lisa A. Viduya, Erich W. Gerbsch, Monty B. Hayes: The Effects of Solder Voids in the Device to Substrate Interface for Electric Vehicle and Other Power Applications (1996).

DOI: 10.1109/pet.1996.565916

Google Scholar

[4] Ninghui Zhu: THERMAL IMPACT OF SOLDER VOIDS IN THE ELECTRONIC PACKAGING OF POWER DEVICES (1999).

Google Scholar

[5] FLOTHERM Version 6. 1, 2005, Flomerics Ltd. , Surrey England.

Google Scholar

[6] M. Yunus and A. Primavera: EFFECT OF VOIDS ON THE RELIABILITY OF BGA/CSP SOLDER JOINTS, IEEWCPMT Int'l Electronics Manufacturing Technology Symposium (2000).

DOI: 10.1109/iemt.2000.910730

Google Scholar