Comprehensive Test Method for Optical Performance of X-Ray Scintillation Crystals

Abstract:

One photoelectrical test method and system were optimal developed for messuring the optical performances of some scintillation crystals. The theoretical Critical Focal Length of the measurement system is firstly deduced and used in order to make the most of both X-ray photons and the effective area of the scintillation crystal panel. Furthermore, coaxial cable ordered is used to replace the carried wire to weaken power noise. Finally, a low-pass filter with 35Hz upper limit cut-off frequency is designed to reduce spike interference of high-frequency noise. Experiments are successfully done to comprehensive test the spectral response, conversion efficiency and spatial resolution of some scintillators, and the results show that the presented system in this paper is helpful to test the scintillator properties.

• Periodical: Applied Mechanics and Materials (Volumes 530-531)
• Pages: 166-170
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.530-531.166
• Online since: February 2014
• Authors: Yue Ping Han*, Rui Hong Li
• Keywords: Conversion Efficiency, Optical Performance, Test Method, X-Ray Scintillation Crystal

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