Research on Parallel Test Task Scheduling Based on Improved Genetic Algorithm and Petri Net

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Abstract:

Parallel test task scheduling is always complex and difficult to optimize. Aiming at this problem, an improved Genetic Simulated Annealing Algorithm based on Petri net is posed to. At first, a Petri net model is established for the system, then the transition sequence is used as task scheduling sequence set path. Genetic Algorithm is introduced in order to get the optimal path. In the process of search, the sequence will be able to stimulate changes as chromosomes, selection, crossover and mutation. In order to prevent premature convergence of the algorithm appears, into the phenomenon of local optimal solution, the individual needs simulated annealing operation, and finally, we can get the shortest time to complete the test task scheduling sequence.

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1119-1122

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March 2014

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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[1] H. Lu, X. Chen: Parallel Test Task Scheduling with Constraints Based on Hybrid Particle Swarm Optimization and Taboo Search, Chinese Journal of Electronics, (2012), pp.615-618.

Google Scholar

[2] R. Xia, M. Q. Xiao: Optimizing the Multi-UUT Parallel Test Task Scheduling Based on Multi-objective GASA. The Eighth International Conference on Electronic Measurement and Instruments, (2007), pp.839-844.

DOI: 10.1109/icemi.2007.4351273

Google Scholar

[3] L. Q. Xiao, X. B. Le: Research on Parallel Test of Combing Timed Petri Net with Genetic-Ant Colony Algorithm, Journal of System Simulation, (2009), pp.7648-7654.

Google Scholar

[4] F. Jiang, H. S. Ding and T. Fu: Orientation density and workspace analysis of a parallel stabilized platform testing system, Journal of Beijing Institute of Technology, (2012), pp.302-308.

Google Scholar

[5] W. H. Li, Y. P. Wang: Implementing parallel test in traditional serial framework ATS, The Tenth International Conference on Electronic Measurement and Instruments, (2011), pp.143-146.

DOI: 10.1109/icemi.2011.6037784

Google Scholar