Research of Storage Failure Mechanism on JZX-10M Aeronautic Sealed Relay

Wang Jia Liu; Yun Xia Chen; Bo Wan

doi:10.4028/www.scientific.net/AMM.543-547.480

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 543-547Research of Storage Failure Mechanism on JZX-10M...

Research of Storage Failure Mechanism on JZX-10M Aeronautic Sealed Relay

Abstract:

This paper attempts to study JZX-10M sealed electromagnetic relays storage failure mechanism through accelerated test. And take internal gas analysis, the relay detector, leak rate measurement, EDS analysis as auxiliary measuring means, after the necessary testing and post-analysis, found that the contact resistance rise because the film-forming gas contamination on internal contact surface. EDS observations of the surface of the carbon atom deposition are not obvious, this paper analyzes the results.

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Periodical:

Applied Mechanics and Materials (Volumes 543-547)

Pages:

480-485

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.543-547.480

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Online since:

March 2014

Authors:

Wang Jia Liu*, Yun Xia Chen, Bo Wan

Keywords:

Accelerated Test, Failure Mechanism, Relay, Sealed, Storage

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References

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