Variable Parameters of Military Electronic Components in High Temperature

Abstract:

Military electronic components apply in high temperature conditions has become one of the hot research field of reliability field, then the temperature characteristics of the military electronic components are known by designers is key to guarantee high reliability of military equipment under high temperature conditions. So, a scheme of the high temperature dynamic test based on low consumed power test circuits and PC is worked out in this paper. It can be used for test the temperature performance of the military electronic components, and feasibility of the schemes are tested and verified by experiment. And the changing law of the components parameter are got in this conditions which found out components parameters approximate linear in 25°C～200°C, of nonlinear in large range in the very high temperature of 200°C～350°C conditions, which can offer some reference value to prolong lifetime of military electron device.

• Periodical: Applied Mechanics and Materials (Volumes 55-57)
• Pages: 2206-2209
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.55-57.2206
• Online since: May 2011
• Authors: Jian Jun Xu, Ya Zhang, Bo Li
• Keywords: Dynamic Testing, High-Temperature, Military Electronic Components, Variable Parameter

References

[1] Li Bo, Zhang Ya. High Temperature Failure Mechanism of Multi-layer Ceramic Capacitor，2010 Asia-Pacific Conference on Information Technology and Ocean Engineering, Macao , January 30-31, 2010， 62～64.

DOI: 10.1109/cicc-itoe.2010.23

[2] Li Bo, Zhang Ya. Parameters Variation Mechanism Study of solid Electrolytic Tantalum Capacitors in Very High Temperature. Transactions of beijing institute of technology, 2009 , 29(10): 921-923.

[3] Zhang Ya, Xu Jianjun, Zhao Heming, Reliability technology of the ammunition and administration，Defence industrial publishing house，2001，30～60.

[4] Chen keming. Study on the application of electronic components. Transmission of Electric System, 1998 (5): 16-22.

[5] Cunningham, J., R. Valentin, C. Hillman, A. Dasgupta, and M. Osterman. 2001. A Demonstration of Virtual Qualification for the Design of Electronic Hardware. Proceedings of the Institute of Environmental Sciences and Technology. Rolling Meadows, IL: IEST.

[6] N. Vichare and M. Pecht, Prognostics and Health Management of Electronics, IEEE Transactions on Components and Packaging Technologies, Vol. 29, No. 1, March 2006, p.222–229.

DOI: 10.1109/tcapt.2006.870387