A TDC Based BIST Scheme for Operational Amplifier

Jun Yuan; Wei Wang

doi:10.4028/www.scientific.net/AMM.644-650.3583

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 644-650A TDC Based BIST Scheme for Operational Amplifier

A TDC Based BIST Scheme for Operational Amplifier

Abstract:

This paper presents a time-to-digital converter (TDC) based built-in self-test (BIST) scheme for operational amplifier (Op Amp). The propagation delay exiting in the transient response of the Op Amp is monitored by the inverter based TDC, and converted into a digital code based on the referenced delay interval of the inverter used in the TDC, as a result, the digital code is finally employed to determine the test rsults. The circuit-level simualtion results of the proposed BIST syetem for a two-stage Op Amp are presented to demonstrated the feasility of the proposed BIST scheme with high fault coverage.

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Periodical:

Applied Mechanics and Materials (Volumes 644-650)

Pages:

3583-3587

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.644-650.3583

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Cite this paper

Online since:

September 2014

Authors:

Jun Yuan*, Wei Wang

Keywords:

Built-In Self-Test, Inverter, Operational Amplifier, Time-To-Digital Converter

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* - Corresponding Author

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