Research of the Determination of Thin Film Optical Constants by Using the Simulated Annealing Algorithm

Wen Liang Wang; Xiao Hong Rong

doi:10.4028/www.scientific.net/AMM.66-68.9

Paper Titles

Preface, Organizing Committee

Antireflection with Multilayer Structure Used on Silicon Solar Cell
p.1

Design of Solar Energy Photon-Thermal Conversion Thin Film System
p.5

Research of the Determination of Thin Film Optical Constants by Using the Simulated Annealing Algorithm
p.9

Stress Corrosion Evaluation of the Overlay of Duplex Stainless Steel
p.14

Experimental Study and Detached Eddy Simulation of the Macro-Instability in an Eccentric Stirred Tank
p.20

Design UCAV Flight Control Law Based on Jamming Observer
p.27

Meshing Efficiency Analysis of 2K-H Type Differential Gear Train Closed by CVT
p.31

The Effect of Two Fault Segments Sliding Velocity on Strong Earthquakes
p.37

HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 66-68Research of the Determination of Thin Film Optical...

Research of the Determination of Thin Film Optical Constants by Using the Simulated Annealing Algorithm

Abstract:

Simulated annealing algorithm is a mathematic model, which imitates the physical process of annealing. And optical thin film is widely used in many industry, To perform the functions for which they were designed, the films must have proper thickness, roughness and other characteristics. In the paper, the simulated annealing algorithm is used to determine the film optical constant It uses the transmission data through thin film over a range of wavelengths to calculate the thickness. According to the experimental results, the solution found by simulated annealing algorithm is unique and correct.

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Periodical:

Applied Mechanics and Materials (Volumes 66-68)

Pages:

9-13

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.66-68.9

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Online since:

July 2011

Authors:

Wen Liang Wang, Xiao Hong Rong

Keywords:

Optical Constant, Simulated Annealing Algorithm, Thin Film

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