Research and Application of S-4800 Scanning Electron Microscope in Modern Testing and Analysis Technology

Quan Wen; Zhao Yang Ding; Fu Sheng Kou; Peng Zhou

doi:10.4028/www.scientific.net/AMM.668-669.936

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 668-669Research and Application of S-4800 Scanning...

Research and Application of S-4800 Scanning Electron Microscope in Modern Testing and Analysis Technology

Abstract:

Mechanism and functions of S-4800 Scanning Electron Microscope are introduced in this paper. The image-forming mechanism and structure of SEM are studied, and the signal transformation of secondary electron and backscattered electron is presented. The main application fields of SEM are researched.

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Periodical:

Applied Mechanics and Materials (Volumes 668-669)

Pages:

936-939

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.668-669.936

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Online since:

October 2014

Authors:

Quan Wen*, Zhao Yang Ding, Fu Sheng Kou, Peng Zhou

Keywords:

Application, Energy Dispersive Spectrometer, Mechanism, Scanning Electron Microscope, Structure

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* - Corresponding Author

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