QXAFS Data Acquisition System Based on EPICS at SSRF

Yong Nian Zhou; Zheng Jiang; Li Fang Zheng; Yong Ping Li

doi:10.4028/www.scientific.net/AMM.687-691.3336

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 687-691QXAFS Data Acquisition System Based on EPICS at...

QXAFS Data Acquisition System Based on EPICS at SSRF

Abstract:

A Quick-scanning XAFS (QXAFS) data acquisition system based on EPICS is achieved at the Shanghai Synchrotron Radiation Facility (SSRF) XAFS beamline. The hardware and software system are introduced. Gas ionization chambers, current amplifiers and data acquisition card are utilized to obtain the X-ray intensity before and after the sample. Four fine QXAFS spectra with an energy range of 1.2 keV at the Cu K-edge have been collected in 5 seconds. The results indicate the good repeatability of the QXAFS data acquisition system. It makes a lot of sense for the researchers to carry out experimental study at SSRF.

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Periodical:

Applied Mechanics and Materials (Volumes 687-691)

Pages:

3336-3341

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.687-691.3336

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Online since:

November 2014

Authors:

Yong Nian Zhou*, Zheng Jiang, Li Fang Zheng, Yong Ping Li

Keywords:

Data Acquisition System, DCM, EPICS, QXAFS, SSRF

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* - Corresponding Author

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