Analysis on the Wind Turbines Current Influenced by the Impedance Variation of Low Voltage Ride through Test Device

Article Preview

Abstract:

To analysis the low voltage ride through tests results carried out in Inner Mongolia, the impedance model of low voltage ride through test equipment ability with the wind turbine is established. The grid current variation caused by series or parallel impedance switching is analyzed theoretically. Results show that grid current will become larger while the parallel impedance of low voltage test equipment is smaller. Consequently, suggestion is proposed to take optimal configuration of impedance in the equipment to reduce effect on grid current, which can ensure the smooth running of low voltage ride through test.

You might also be interested in these eBooks

Info:

Periodical:

Advanced Materials Research (Volumes 1070-1072)

Pages:

216-219

Citation:

Online since:

December 2014

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2015 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] J.B. Hu, Y.K. He: Automation of Electric Power Systems, 2008, 32(2): 94-9.

Google Scholar

[2] L. Liang, J.L. Li, H.H. Xu: Power Electronics, 2008, 42(3): 19-21.

Google Scholar

[3] National Electricity Regulatory Standardization Technical Committee: GB/T19963-(2011).

Google Scholar

[4] Ledesm A, Usaola J: IEEE Tran on Energy Conversion, 2005, 20(2): 388-397.

Google Scholar

[5] Magueed F A, Sannino A, Svensson J: IEEE 35th Annual, 2004: 1163-1168.

Google Scholar

[6] The Institute of Electrical and Electronics Engineers, Inc. IEEE standard for distributed resources interconnection with electric power systems[S]. New York: The Institute of Electrical and Electronics Engineers, Inc., (2003).

Google Scholar

[7] Abbey C, Joos G: IEEE. Power Engineering Society General Meeting, San Francisco, 2005: 1901-(1907).

Google Scholar

[8] W. Wang, M.D. Sun, X.D. Zhu: Automation of Electric Power Systems, 2007, 31(23): 84-89.

Google Scholar

[9] Rathi M R, Mohan N: 31st Annual Conference of IEEE, Raleigh, 2005: 2-3.

Google Scholar