Photoelectric Property Measurement of Organic Materials Based on TOF Method

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Abstract:

The principle and experimental setup of photoelectric property measurement withTime of Flight (TOF) method are described. Si sample is used to affirm thevalidity of the experiment setup. The photoelectric property of MEH-PPVmaterials is measured and the mobility is accounted base on TOF method. Moreover,the attention items of using TOF method are proposed. The results consist well with the theoretical value.

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Advanced Materials Research (Volumes 1079-1080)

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42-45

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December 2014

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© 2015 Trans Tech Publications Ltd. All Rights Reserved

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