Advanced Materials Research Vol. 1083

Abstract: The transformer rated secondary load in electric energy metering device was much larger before electric energy metering device revamp. Big energy differences exist before and after the revamp. The reason of making down rated secondary load and its influence on transformer error and energy metering are analyzed in the presented work.

Abstract: Testing of level measurement devices is a very important process. Many of these devices use electric signals acquired from sensor modules in real environment. That is why throughout this paper a concept and correspondent tool for artificial synthesizing and replaying of such signals is developed. Benefits of the work include new possibilities for testing devices in more realistic conditions with controlled arbitrary sensor input, demonstrating level measurement process without actual environment and improving process of educating the personal by simplifying the learning curve of device functionality and level recognition algorithms.

Abstract: I-V-characteristics of an irradiated transistor in many cases should be measured inside the radiation chamber with long cables, which introduces noticeable measurement error. In this paper IV-characteristics of an irradiated bipolar junction transistor measured with the 4-wire and the 2-wire circuits are presented and compared to direct (without cables) measurements. Significant enlargement of measurement error for the 2-wire method in comparison with the 4-wire method is shown for different currents.

Abstract: The numerical simulation of oblique towing tests (OTT) and rotating arm tests (RAT) for a submarine model was undertaken with the same grid topology. As for the OTT simulation, to improve the efficiency and accuracy of the computation, the drift sweep procedure was adopted. In contrast with the steady drift case, rotating motion for a submarine is more complex. The rotating reference frame was adopted to deal with the rotation problem. The Coriolis force and centrifugal force due to the computation in a body-fixed rotating coordinate system were treated explicitly and added to the momentum equations as source terms. The user-defined boundary conditions were coded to give the correct magnitude and direction of entrance velocity. Lastly, the computed forces and moments as a function of drift angle during the two kinds of simulations were compared with experimental results, as well as literature values. They always show the correct trend. The flow field and streamline patterns in rotating motion were depicted. It indicates that the method used in the paper is reliable and the same grid topology can be used for the simulation of two simplified maneuvers.

Abstract: This paper shows a comparison between two different MOSFET structures: a conventional layout (CM) and Diamond (DM - enclosed layout transistor), as tolerance to the Single Event effect - SEE. Both CMOS 0.35μm technology devices types have the same geometric factor (W/L) and during irradiation were monitored continuously to detect and acquire the SEEs applying a new approach with a PXI test system. For this work was used heavy ion beams produced at the São Paulo 8 UD Pelletron accelerator.

Abstract: The distant access of the alarm registration centre to technical devices increases the technical specialists ́ productivity since they do not have to travel physically to the customers who are tens kilometres away. Due to the elimination of the need to travel, the time is saved and the operational costs of controlled devices are significantly lowered. The distant access solution has already been implemented in practice and provides the technicians of the assembly company with the preliminary default diagnostics, and thus accelerating their removal.

Abstract: Automatic monoclonal colony picking machine with 96-probe picking module were employed to improve picking efficacy. The paper proposes a modified genetic algorithm based on dual-sequenced real coded andnew crossover operator to reduce the moving distance of the picking module in picking process. The algorithm makes the picking process more efficient. It also has good convergence speed and outstanding ability to overcome the premature convergence.

Abstract: An automatic equipment for measurement of voltage-current characteristic of semiconductor devices was described. The technique for precision voltage setting, which enables to obtain ±1mV accuracy in ±10V range, was described. Logarithmic current sensors were used for measurements of the current and calibration technique of the sensors was presented. It provides relative accuracy 1% in wide current range (0,1nA..10mA).