Effect of High Intensity Pulsed Ion Beam of Carbon on Subsurface Layers of Zirconia Ceramics

Anatoly Surzhikov; Ivan Vasiliev; Sergei A. Ghyngazov; Tamara Frangulyan; Aleksandr Chernyavski

doi:10.4028/www.scientific.net/AMR.1085.270

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1085Effect of High Intensity Pulsed Ion Beam of Carbon...

Effect of High Intensity Pulsed Ion Beam of Carbon on Subsurface Layers of Zirconia Ceramics

Abstract:

The effect of high intensity pulsed beam (HIPB) of accelerated carbon ions on zirconia ceramics of the 97ZrO₂-3Y₂O₃ (in mol %) composition is investigated. The parameters of the ion beam are as follows: the energy of the accelerated ions is 200 keV, pulse duration is 100 ns, pulse current density equal to 40 and 150 A/cm². It was revealed that ions treatment of ceramics leads to melting of the subsurface layer. In this area, the grains are elongated towards the surface. Upon treatment of ceramics by accelerated ions with the pulse energy density equal to 3 J/cm² (fluence ≥ 9.4•10¹⁵ cm^–2), formation of zirconia cubic phases up to 30 mass % is observed. The size of coherent-scattering region X-rays of the grains of the c-ZrO2 phase is 15–20 nm. The analysis of the elemental composition of the irradiated surface layers by secondary ion mass spectrometry (SIMS) method makes possible to conclude that formation of high concentration of non-stoichiometric oxygen vacancies under ion treatment is the main cause of the cubic phase stabilization in zirconia.

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Advanced Materials Research (Volume 1085)

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270-275

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1085.270

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Online since:

February 2015

Authors:

Anatoly Surzhikov, Ivan Vasiliev, Sergei A. Ghyngazov, Tamara Frangulyan, Aleksandr Chernyavski

Keywords:

High Intensity Pulsed Beam, Scanning Electron Microscopy, Secondary Ion Mass Spectrometry, Subsurface Layer, Surface Modification, X-Ray Diffraction, Zirconium Ceramic

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