Properties of BaZr_xTi_1-x O₃ Thick Film Deposited Using EPD Method

Abstract:

Barium zirconate titanate, BaZr_xTi_1-xO₃, (BZT) with x compositions have been widely studied as a potential candidate for antenna application. In this study, BZT film was prepared using the electrophoretic deposition (EPD) method. The EPD method was used to produce BZT composite into film for miniaturization purposes and dielectric properties improvement. The EPD process was performed with varying pH, voltages, deposition time and amount of Zr. The results showed that optimum deposition time was obtained at pH 4, 90V and 1 minute deposition time. Increasing Zr content decreased the dielectric constant of the BZT composite, and increased the loss tangent of the samples. The result is in agreement with microstructure observation that Zr addition in BZT decreased the grain size that suppressed the dielectric properties. This makes BZT is a suitable candidate for antenna application.

• Periodical: Advanced Materials Research (Volume 1087)
• Pages: 465-469
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.1087.465
• Online since: February 2015
• Authors: Khairunisak Abdul Razak*, Fei San Khoo, Srimala Sreekantan, Zainovia Lockman
• Keywords: Dielectric, Electrohoretic Deposition, Thick Film

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