Structure and Electrical Properties of Highly (100)-Oriented Ba(Zr0.05Ti0.95)O3 Films Prepared by Chemical Solution Deposition

Yi Ping Guo; Kazuyuki Suzuki; Kaori Nishizawa; Takeshi Miki; Kazumi Kato

doi:10.4028/www.scientific.net/AMR.11-12.101

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 11-12Structure and Electrical Properties of Highly...

Structure and Electrical Properties of Highly (100)-Oriented Ba(Zr_0.05Ti_0.95)O₃ Films Prepared by Chemical Solution Deposition

Abstract:

A chemical solution deposition process for preparation of highly (100)-oriented Ba(Zr0.05Ti0.95)O3 films was developed. The orientation degree of Ba(Zr0.05Ti0.95)O3 thin films prepared by this process can reach up to 99.1%. The electrical properties of the (100)-oriented films prepared by this process have been studied. The Ba(Zr0.05Ti0.95)O3 films with a thickness of about 270 nm show a dielectric constant of ∼740 and a loss tangent of ∼3%. The remanent polarization (2Pr) and coercive field (2Ec) are 3.2 μC/cm2 and 34 kV/cm, respectively.