Temperature Dependence on Dielectric Response of La0.7Ba0.3Mn0.4Ti0.6O3 Ceramic

Aaliyawani Ezzerin Sinin; Walter Charles Primus; Abdul Halim Shaari; Zainal Abidin Talib; Sinin Hamdan

doi:10.4028/www.scientific.net/AMR.1107.45

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1107Temperature Dependence on Dielectric Response of...

Temperature Dependence on Dielectric Response of La_0.7Ba_0.3Mn_0.4Ti_0.6O₃ Ceramic

Abstract:

Ceramic sample of La_0.70Ba_0.30Mn_0.40Ti_0.60O₃ oxide has been prepared by the conventional solid-state reaction method. The sintered sample was characterized by using x-ray diffraction (XRD) and low frequency LCR meter. XRD result shows that the sample has a cubic structure with the existence of impurity phase. The dielectric properties of La_0.70Ba_0.30Mn_0.40Ti_0.60O₃ measured from room temperature to 200°C shows that the dielectric permittivity is temperature dependence with strong dispersion at low frequencies. A circuit model based on the universal capacitor response function is also being used to represent the dielectric properties of the sample.

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Periodical:

Advanced Materials Research (Volume 1107)

Pages:

45-52

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1107.45

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Online since:

June 2015

Authors:

Aaliyawani Ezzerin Sinin, Walter Charles Primus*, Abdul Halim Shaari, Zainal Abidin Talib, Sinin Hamdan

Keywords:

Ceramic, Circuit Model, Crystal Structure, Dielectric Property

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