Optical Characterization and Quality Control Methods of Thin Ferroelectric Films

B.V. Karlenko; Oleksiy V. Makarenko; Leonid V. Poperenko; Toru Aoki

doi:10.4028/www.scientific.net/AMR.1117.44

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Adsorption of Pyrrole on the Si(111)-7×7 Surface: Effect of Substrate Temperature
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Total Absorption Based on Smooth Double-Turn Helices
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Optical Characterization and Quality Control Methods of Thin Ferroelectric Films
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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1117Optical Characterization and Quality Control...

Optical Characterization and Quality Control Methods of Thin Ferroelectric Films

Abstract:

On an example of poly(vinylidene fluoride - trifluorethylene) ferroelectric polymer we have shown how different optical methods can be applied for basic optical constants such as refractive index and absorption coefficient obtaining, scattering surface quality control, spectral transmission range control, examining polarization degree etc. Wide range of these methods can be applied not only to thin ferroelectric films but for other different samples.

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Periodical:

Advanced Materials Research (Volume 1117)

Pages:

44-47

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1117.44

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Online since:

July 2015

Authors:

B.V. Karlenko*, Oleksiy V. Makarenko, Leonid V. Poperenko, Toru Aoki

Keywords:

Ellipsometry, Ferroelectric, Gonio, Optics, PVDF, Spectrophotometry, Thin Film

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