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Measuring Microscopic Properties of a Single-Crystalline Diamond by Nano-Indentation Technology

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Abstract:

Nano-indentation technology was brought to study microscopic mechanical properties of a single-crystalline diamond (SCD). Nano-indentation measurement was conducted on the {100} plane of SCD, and influences of various factors on measured results were analyzed, from which methods were confirmed to improve veracity of measurement. Properties of the indenter were checked with a fused silica sample both before and after indentation on diamond, which provided guarantee to veracity of results on diamond. It was found that tilt of diamond surface had so great influence that it could damage the indenter, and make the indentation curves anomalous. While damage of indenter could be avoided and valid measurement results could be obtained when tilt of diamondsurface was decreased below 0.10º and the maximal indentation force was less than 10 mN. Deformation of the diamond was almost full-elastic during indentation process. Indentation hardness of {100} plane of the SCD was about 70 GPa with standard deviation less than 3 GPa. And there had good reproducibility between two groups of measurements.

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Info:

Periodical:

Advanced Materials Research (Volumes 1120-1121)

Pages:

378-382

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1120-1121.378

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Online since:

July 2015

Authors:

Qi Long Wei*, Xiao Bin Yue, Xiao Yuan Li, Bo Liu, Xiao Feng Zhang, Da Jiang Lei

Keywords:

Nano-Indentaion, Single-Crystallineline Diamond, Tilt of Surface, Ultra-Hard, Validation

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© 2015 Trans Tech Publications Ltd. All Rights Reserved

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