Analyzing TEM Images for Accurate Determination of Lattice Parameters of Vacuum Evaporated SnSe Thin Film by Image Processing Software

Abstract:

Amorphous SnSe thin films were deposited by thermal evaporation technique on glass substrates kept at room temperature in a vacuum better than 10^-5Torr. A detailed study of structural and optical properties of 150 nm thin film was carried out. The selected area diffraction patterns obtained by TEM for this thin film were analyzed by a new method that involves accurate determination of lattice parameters by image processing software. The obtained results are in good agreement with the JCPDS data. Optical transmission spectra obtained at room temperature were analyzed to study optical properties of deposited thin films. It has been found that indirect carrier transition is responsible for optical absorption process in the deposited thin films.

• Periodical: Advanced Materials Research (Volume 1141)
• Pages: 51-53
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.1141.51
• Online since: August 2016
• Authors: Chetan Zankat*, V.M. Pathak, Pratik Pataniya, G.K. Solanki, K.D. Patel, Salil Nair, Jolly Mary Joy
• Keywords: Image Processing Software, Optical Studies, SnSe Thin Films, Structural Studies, Thermal Evaporation

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