Challenges and Approaches for Metrology of Additive Manufactured Lattice Structures by Industrial X-Ray Computed Tomography

Abstract:

Lattice structures can be highly complex imitating natural cellular materials. By the wide adoption of additive manufacturing technologies, lattice structures are a popular design element with many advantages for lightweight and highly functional parts. A detailed examination and an intense inspection of this type of new design element and this new production method is necessary to enable a broad industrialization. In this study we demonstrate how to use x-ray based industrial CT to measure lattice structures in additive manufacturing. This paper shows certain challenges and approaches for metrology on lattice structures. The results show significant deviations between designed and built parts, highlighting the need for quantification and non-destructive inspection.

• Periodical: Advanced Materials Research (Volume 1161)
• Pages: 131-136
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.1161.131
• Online since: March 2021
• Authors: Philip Sperling*, Anton du Plessis, Gerd Schwaderer
• Keywords: Additive Manufacturing, Computed Tomography, Lattice Structure, Metrology

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