Dynamic Detection and Analysis of Raw Silk’s Flatness

Abstract:

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The shape of most raw silk’s cross-section can be regarded as ellipse approximately. Axial length of the raw silk’s cross-section was detected and recorded dynamically by photoelectric sensor combined with the software of LabVIEW. Two photoelectric sensors were located orthogonally to measure axial lengths of the ellipse. The major and minor values can be considered as the major and minor axis values of the raw silk’s elliptical cross-section respectively. Thereby, the flatness and the area of raw silk’s cross-section can be calculated according to the values of major and minor axes. In addition, the raw silk’s evenness was characterized based on the variation of the cross-sectional area.

Info:

Periodical:

Advanced Materials Research (Volumes 175-176)

Main Theme:

Edited by:

Lun Bai and Guo-Qiang Chen

Pages:

385-388

DOI:

10.4028/www.scientific.net/AMR.175-176.385

Citation:

X. Zhang et al., "Dynamic Detection and Analysis of Raw Silk’s Flatness", Advanced Materials Research, Vols. 175-176, pp. 385-388, 2011

Online since:

January 2011

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Price:

$35.00

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