Dynamic Detection and Analysis of Raw Silk’s Flatness

Xin Zhang; Yi Quan Xu; Kai Meng; Qing Guan Chen

doi:10.4028/www.scientific.net/AMR.175-176.385

Paper Titles

Feature Extraction Using Auto-Regression Spectral Analysis for Fabric Defect Detection
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Automatic Inspection of Silk Fabric Density Based on Multi-Scale Wavelet Analysis
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The Design of Untwisted Yarn-Dyed Dobby Double-Faced Fabric
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Analysis of the Additional Twists on the Fiber Band in Compact Field of Compact Spinning
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Dynamic Detection and Analysis of Raw Silk’s Flatness
p.385

Study on the Surface Color Mixing Effect of Fabric with Different Colors of Warp and Weft
p.389

Development of New Apparatus for Slug Detection on the Loom
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Modern Home Textiles Database Query System
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The Discussion of the Yarn Cross-Section Shape of Woven Fabrics
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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 175-176Dynamic Detection and Analysis of Raw Silk’s...

Dynamic Detection and Analysis of Raw Silk’s Flatness

Abstract:

The shape of most raw silk’s cross-section can be regarded as ellipse approximately. Axial length of the raw silk’s cross-section was detected and recorded dynamically by photoelectric sensor combined with the software of LabVIEW. Two photoelectric sensors were located orthogonally to measure axial lengths of the ellipse. The major and minor values can be considered as the major and minor axis values of the raw silk’s elliptical cross-section respectively. Thereby, the flatness and the area of raw silk’s cross-section can be calculated according to the values of major and minor axes. In addition, the raw silk’s evenness was characterized based on the variation of the cross-sectional area.

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Periodical:

Advanced Materials Research (Volumes 175-176)

Pages:

385-388

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.175-176.385

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Online since:

January 2011

Authors:

Xin Zhang, Yi Quan Xu, Kai Meng, Qing Guan Chen

Keywords:

Dynamic Detection, Flatness, LabVIEW, Raw Silk’s Cross Section

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References

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