Growth of Double-Side Tl-2212 Thin Film on CeO2-Buffered MgO Substrate

Abstract:

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The double-side Tl-2212 films were fabricated on CeO2-buffered MgO substrates by dc magnetron sputtering and post-annealing method. The RF magnetron sputtering technology was used to grow CeO2 buffer layers. XRD and SEM measurements showed that the CeO2 films on annealed MgO substrates were highly c-axis orientation, and the Tl-2212 superconducting films on both sides had similar morphology and crystalline structure. For both sides of Tl-2212 films, the critical transition temperatures (Tc) were above 106 K, and the critical current densities (Jc) were above 2.2 MA/cm2 (77 K, 0 T).

Info:

Periodical:

Advanced Materials Research (Volumes 194-196)

Edited by:

Jianmin Zeng, Taosen Li, Shaojian Ma, Zhengyi Jiang and Daoguo Yang

Pages:

2384-2387

DOI:

10.4028/www.scientific.net/AMR.194-196.2384

Citation:

Q. L. Xie et al., "Growth of Double-Side Tl-2212 Thin Film on CeO2-Buffered MgO Substrate", Advanced Materials Research, Vols. 194-196, pp. 2384-2387, 2011

Online since:

February 2011

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Price:

$35.00

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