Dielectric Properties of La, Sm Ion-Doped BZT-Based Ceramics

Zhan Shen Zheng; Rui Jiao Li; Pei Qi Yan; Hong Kui Hu; Yuan Liang Li; Li Jing Hao

doi:10.4028/www.scientific.net/AMR.197-198.310

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 197-198Dielectric Properties of La, Sm Ion-Doped...

Dielectric Properties of La, Sm Ion-Doped BZT-Based Ceramics

Abstract:

It is important to develop a new special material to satisfy the requirement of producing capacitor with higher property. BZT(Ba(Zr_xTi_1-x)O₃) ceramics of La₂O₃ and Sm₂O₃ doped was fabricated by the conventional method of solid reaction. These ceramics were tested by X-ray diffraction (XRD), Impedance Tester, and LCR Tester with temperature controlling systems. The results indicate that dielectric property of BZT ceramics doped 0.05mol% La2O3, 0.2mol% Sm₂O₃ simultaneously and calcined in 1280°C is the best. Moreover, it was found that Sm₂O₃ had the functions of moving Tc of matrix material to a low temperature and making the peak wider.

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Periodical:

Advanced Materials Research (Volumes 197-198)

Pages:

310-313

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.197-198.310

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Online since:

February 2011

Authors:

Zhan Shen Zheng, Rui Jiao Li, Pei Qi Yan, Hong Kui Hu, Yuan Liang Li, Li Jing Hao

Keywords:

Barium Zirconate Titanate, Curie Temperature, Dielectric Property, Lanthanum Oxide, Samarium Oxide

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