CAN Bus Based on Intelligent Built-In Test Technique in Complex Electronic System

Abstract:

Built-in Test (BIT) technique is a important equipment in complex electronic system. In this paper, the CAN bus based on intelligent built-in test technique in complex electronic system was presented to make use of the advantages of CAN bus to solve the problems of communication and reliability of the distributed intelligent BIT system. This paper elaborates the structure of intelligent BIT system and the fault-detection technique, and the nodes in intelligent BIT system are equipped with the CAN bus interface. It also describes the software and hardware design of intelligent BIT node. The high-speed communication and reliability of CAN bus facilitate the communication and timely disposal of the testing signal and the intelligent BIT design. Experiments and practical applications approved that this technical method was feasible and effective.

• Periodical: Advanced Materials Research (Volumes 204-210)
• Pages: 1876-1879
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.204-210.1876
• Online since: February 2011
• Authors: Lin Lei, Hou Jun Wang
• Keywords: CAN Bus, Electronic System, Intelligent BIT

References

[1] Wen Xisen, Xu Yongcheng, Yi Xiaoshan, Chen Xun. Theory and application of intelligent Built-in Test,. [M] Beijing: National Defence Industry Press, 2002. pp.122-146.

[2] Lei Lin. Control network based on fieldbus,. [M] Beijing: Publishing House of Electronics Industry. April 2004, pp.378-398.

[3] Lei Lin, Wang Houjun. Built-in Test Design of Complex Electronic System based on CAN Bus,. Chinese Journal of Scientific Instrument, Vol. 25, No. 3, June 2004 , pp.568-571.

[4] Shan Qingxiao, Pan Mengchun, Weng Feibing. Application of BIT Design for Electric Vehiche" [J] IEEE PEDS, 1999, (1999).

[5] Shi Xianjun, Qu Dongcai, Nie Ziling. Design of a kind of Digital-controller-Embedded BIT system,. Computer Measurement&Control, 2002, Vol. 10, No. 4, pp.252-254.