[1]
U. Ozgur, Y.I. Alivov, C. Liu, A. Teke, M.A. Reshchikov, S. Dogan, V. Avrutin, S.J. Cho, H. Morkoc, J. Appl. Phys. 98 (2005), p.041301.
Google Scholar
[2]
D. G. Thomas, J. Phys. Chem. Solids 15 (1960), pp.86-96.
Google Scholar
[3]
Uwe. Rau, M. Schmidt, Thin Solid Films 387 (2001), pp.141-146.
Google Scholar
[4]
J. -B. Lee, H. -J. Lee, S. -H. Seo and J. -S. Park, Thin Solid Films 387-399 (2001), p.641–646.
Google Scholar
[5]
S. Liang, H. Sheng, Y. Liu, Z. Huo, Y. Lu and H. Shen, J. Cryst. Growth 225 (2001), pp.110-113.
Google Scholar
[6]
A. Dinia, G. Schmerber, C. Meny, V. Pierron-Bohnes, E. Beaurepaire, J. Appl. Phys. 97 (2005), p.123908.
DOI: 10.1063/1.1937478
Google Scholar
[7]
A. Trinchi, Y.X. Lia,W. Wlodarski, S. Kaciulis, L. Pandolfi, S.P. Russo, J. Duplessis, S. Viticoli, Sens. Actuators A 108 (2003), p.263–270.
DOI: 10.1016/s0924-4247(03)00359-5
Google Scholar
[8]
V. Srikant and D. R. Clarke, J. App. Phys. 81 (1997), p.6357.
Google Scholar
[9]
D.M. Bangall, Y.F. Chen, Z. Zhu, T. Yao, S. Koyama, M.Y. Shen, T. Goto, Appl. Phys. Lett. 70 (1997), p.2230.
Google Scholar
[10]
Sang-Hun Jeong, Bong-Soo Kim, and Byung-Teak Lee, Appl. Phys. Lett. 82 (2003), p.2625.
Google Scholar
[11]
J. J. Wu, S. C. Liu, Adv. Mater. 14 (2002), pp.215-218.
Google Scholar
[12]
F. X. Xiu, Z. Yang, L. J. Mandalapu, D. T. Zhao1, J. L. Liu and W. P. Beyermann, Appl. Phys. Lett. 87 (2005), p.152101.
Google Scholar
[13]
S. A. Studenikin, Nickolay Golego, and Michael Cocivera , J. Appl. Phys. 83(1998), p.2104.
Google Scholar
[14]
N. Naghavi, A. Rougier, C. Marcel, C. Guéry, J. B. Leriche and J. M. Tarascon, Thin Solid Films 360 (2000), pp.233-240.
DOI: 10.1016/s0040-6090(99)01098-6
Google Scholar
[15]
Dinghua Bao, Haoshuang Gu and Anxiang Kuang, Thin Solid Films 312 (1998), pp.37-39.
Google Scholar
[16]
E. Bacaksiz, M. Parlak, M. Tomakin , A. Özcelik, M. Karakız, M. Altunbas, Journal of Alloys and Compounds 466 (2008), p.447–450.
Google Scholar
[17]
L. Znaidi, G.J.A.A. Soler-Illia, R. Le Guennic, A. Kanaev and C. Sanchez. J. Sol–Gel Sci. Tech. 26 (2003), p.817.
DOI: 10.1023/a:1020795515478
Google Scholar
[18]
M. Dutta, S. Mridha, D. Basak, Applied Surface Science 254 (2008), p.2743–2747.
Google Scholar
[19]
Sang Hoon Yoon, Dan Liu, Dongna Shen, Minseo Park and Dong-Joo Kim, J Mater Sci. 43(2008), p.6177–6181.
Google Scholar
[20]
Rizwan Wahab, S.G. Ansari, Young Soon Kim, Minwu Song, Hyung-Shik Shin, Applied Surface Science 255 (2009) p.4891–4896.
Google Scholar
[21]
V. Fathollahi, M. Mohammadpour Amini, Materials Letters 50 (2001), p.235–239.
Google Scholar
[22]
A. Guillén-Santiago, M. de la L. Olvera, A. Maldonado, R. Asomoza, D. R. Acosta, phys. stat. sol. (a) 201 (2004), p.952–959.
Google Scholar
[23]
Yaoming Li, Linhua Xu, Xiangyin Li, Xingquan Shen, Ailing Wang, Applied Surface Science 256 (2010), p.4543–4547.
Google Scholar
[24]
Parmod Sagar, P.K. Shishodia, R.M. Mehra, Applied Surface Science 253 (2007), p.5419–5424.
DOI: 10.1016/j.apsusc.2006.12.026
Google Scholar
[25]
Kun-YangWu, Cheng-ChuanWang, Dong-Hwang Chen, Nanotechnology 18 (2007), p.305604.
Google Scholar
[26]
S.M. Rozati S. Moradi, S. Golshahi, R. Martins , E. Fortunato, Thin Solid Films 518 (2009), p.1279–1282.
DOI: 10.1016/j.tsf.2009.03.231
Google Scholar
[27]
B.D. Cullity, S.R. Stock, Elements of X-ray Diffraction, Prentice-Hall, Inc., New Jersey, (2001), p.388.
Google Scholar
[28]
A. Maldonado a, S. Tirado-Guerra b, M. delaL. Olvera, Journal of Physics and Chemistry of Solids 70 (2009), p.571–575.
Google Scholar
[29]
Z.B. Fang, Z.J. Yan, Y.S. Tan, X.Q. Liu, Y.Y. Wang, Applied Surface Science 241 (2005), p.303–308.
Google Scholar
[30]
James B. Miller, Hsin-Jung Hsieh, Bret H. Howard , Esteban Broitman, Thin Solid Films 518 (2010), p.6792–6798.
DOI: 10.1016/j.tsf.2010.06.032
Google Scholar
[31]
S. Joon Kwon, Jae-Hwan Park, and Jae-Gwan Park, PHYSICAL REVIEW E 71(2005), p.011604.
Google Scholar
[32]
Soumendra K. Basu, Aaron M. Bergstreser, L. F. Francis L. E. Scriven, and A. V. McCormick, JOURNAL OF APPLIED PHYSICS 98(2005), p.063507.
DOI: 10.1063/1.2043255
Google Scholar
[33]
Chien-Yie Tsay, Hua-Chi Cheng, Chin-Yi Chen, Kan-Ju Yang, Chung-Kwei Lin, Thin Solid Films 518 (2009), p.1603–1606.
Google Scholar
[34]
L. Znaidi, G.J.A.A. Soler Illia, S. Benyahia, C. Sanchez, A.V. Kanaev, Thin Solid Films 428 (2003), p.257–262.
DOI: 10.1016/s0040-6090(02)01219-1
Google Scholar
[35]
D. Vernardou , G. Kenanakis, S. Couris, E. Koudoumas, E. Kymakis, N. Katsarakis, Thin Solid Films 515 (2007), p.8764–8767.
DOI: 10.1016/j.tsf.2007.03.108
Google Scholar
[36]
P.K. Sharma, M.H. Jilavi, V.K. Varadan, H. Schmidt, Journal of physics and chemistery of Solids 63 (2002), p.171–177.
Google Scholar