Structure Characterization of Electrodeposited Zinc Selenide Thin Films

Abstract:

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Crystalline thin of zinc selenide have been electrochemically deposited on conducting substrates of indium tin oxide, ITO glass. Initial investigation with voltammetry was done and shows that the zinc selenide films were stable towards oxidation. The best deposition potential obtained was at -0.95 V vs. Ag /AgCl while at lower deposition potentials, the films do not form well. Energy Dispersive Analysis and X-Ray spectrum indicate that the films deposited at 65oC and -0.95 V vs. Ag/AgCl have nearly stoichiometric Zn: Se ratio.

Info:

Periodical:

Advanced Materials Research (Volumes 264-265)

Edited by:

M.S.J. Hashmi, S. Mridha and S. Naher

Pages:

732-737

DOI:

10.4028/www.scientific.net/AMR.264-265.732

Citation:

S.A. Mohamad et al., "Structure Characterization of Electrodeposited Zinc Selenide Thin Films", Advanced Materials Research, Vols. 264-265, pp. 732-737, 2011

Online since:

June 2011

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Price:

$35.00

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