Evolution of Raft Structure during Creep Deformation of the Ni-Based Single-Crystal Superalloy TMS-138

Nobuyasu Tsuno; Akihiro Sato; Katsushi Tanaka; Haruyuki Inui

doi:10.4028/www.scientific.net/AMR.278.19

Paper Titles

Preface and Organizing Committee

Mechanical Properties of the Ternary L1₂ Compound Co₃(Al,W) in Single and Polycrystalline Forms
p.1

Dislocation Mechanisms during High Temperature Creep Experiments on MC2 Alloy
p.7

Evolution of Raft Structure during Creep Deformation of the Ni-Based Single-Crystal Superalloy TMS-138
p.19

Dislocation Structures in the Gamma Prime-Phase of CMSX-4 and TMS75 after Degradation under Service Conditions
p.25

Dissolution of Fine γ’ Precipitates of MC2 Ni-Based Single-Crystal Superalloy in Creep-Fatigue Regime
p.31

Diffraction Profile, Strain Distribution and Dislocation Densities during Stage II Creep of a Superalloy
p.37

In Situ Investigation with Neutrons on the Evolution of γ ' Precipitates at High Temperatures in a Single Crystal Ni-Base Superalloy
p.42

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 278Evolution of Raft Structure during Creep...

Evolution of Raft Structure during Creep Deformation of the Ni-Based Single-Crystal Superalloy TMS-138

Abstract:

The evolution of the raft structure in the Ni-based single-crystal superalloy TMS-138 crept at 1100 °C and 137 MPa has been investigated quantitatively by the Fourier analysis of scanning electron microscope (SEM) images. This method of analysis quantifies the extent of tilting of the γ/γ′ interface during creep deformation. The analysis is carried out on two different crystallographic planes, (100) and (110), on which SEM observations of deformation microstructures are made, to see if there is any difference in the results of analysis depending on observation planes. The tilt angle of the γ/γ′ interface, which is deduced by the Fourier analysis, increases with the accumulation of creep strain. The rate of the increase in the tilt angle is significantly large in the tertiary creep stage. The result of analysis does not depend significantly on crystallographic planes on which SEM observations of microstructures are made.

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Periodical:

Advanced Materials Research (Volume 278)

Pages:

19-24

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.278.19

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Online since:

July 2011

Authors:

Nobuyasu Tsuno, Akihiro Sato, Katsushi Tanaka, Haruyuki Inui

Keywords:

Creep, Fourier Analysis, Ni Based Superalloy, RAFT, Single Crystal

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