Effect of the Thickness of Cr Interlayer on the High-Frequency Characteristics of FeCoTa/Cr/FeCoTa Multilayers

Abstract:

The effect of non-ferromagnetic Cr interlayer on the high-frequency ferromagnetic properties (HFFMPs) was investigated by use of FeCoTa/Cr/ FeCoTa triple layered films. In conventional thought, the metal interlayer gives rise to a high eddy current loss and therefore a deteriorated HFFMP. However, it is found that HFFMPs depend on the thickness of Cr interlayer. The HFFPMs are improved by Cr-interlayer with a thickness less than 12 nm (sample C1). Comparing with the Cr-interlayer-free FeCoHf single layered film (sample C0), the magnetic anisotropy field of C1 dramatically increases from 185 Oe for C0 to 558 Oe for C1. As a consequence, a high ferromagnetic resonance frequency over than 3 GHz is achieved for sample C1. When the thickness of Cr-interlayer is more than 120 nm (C2), the HFFMPs are reduced due to the increase of eddy current loss and magnetic decoupling between the ferromagnetic layers.

• Periodical: Advanced Materials Research (Volumes 287-290)
• Pages: 1356-1359
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.287-290.1356
• Online since: July 2011
• Authors: Shan Dong Li, Feng Xu, Ming Liu, Yi Hu, Jian Peng Wu, Xin Le Cai, Jie Qiu, Jian Hua Lin, Jenq Gong Duh
• Keywords: High-Frequency Ferromagnetic Films, Interface Coupling, Multilayer

References

[1] Y. Hayakawa, A. Makino, H. Fujimori and A. Inoue: J. Appl. Phys. Vol. 81 (1997), p.3747

[2] T. Sato, Y. Miura, S. Matsumura, K. Yamasawa, S. Morita, Y. Sasaki, T. Hatanai and A. Makino: J. Appl. Phys. Vol. 83 (1998), p.6658

DOI: 10.1063/1.367586

[3] S. Yabukami, M. Yamaguchi, K.I. Arai, M. Watanable, A. Itagaki and H. Ando: J. Appl. Phys. Vol. 85 (1999), p.5148

[4] S.E. Russek, P. Kabos, T. Silva, F.B. Mancoff, D. Wang, Z.H. Qian and J.M. Daughton: IEEE Trans. on Magn. Vol. 37 (2001), p.2248

DOI: 10.1109/20.951138

[5] M. Esseling, Y. Luo and K. Samwer: Europhy. Lett. Vol. 68 (2004), p.100

[6] G.S.D. Beach and A.E. Berkowitz: IEEE Trans. Magn. Vol. 41(2005), p. (2043)

[7] Y. Luo, M. Esseling, K. Zhang, G. Guantherodt and K. Samwer: Europhys. Lett. Vol. 73 (2006), p.415

[8] M. Yamaguchi, M. Baba and K.I. Arai: IEEE Trans. on. Microwave Theo. Tech. Vol. 49 (2001), p.2331

[9] I. Fergen, K. Seemann, A. vd Weth and A. Schüppen: J. Magn. Magn. Mater. Vol. 242-245 (2002), p.146

[10] K. Ikeda, K. Kobayashi, K. Ohta, R. Kondo, T. Suzuki and M. Fujimoto: IEEE Trans. on Magn. Vol. 39 (2003), p.3057

[11] J.C. Sohn, D.J. Byun and S.H. Lim: J. Magn. Magn. Mater. Vol. 272-276 (2004), p.1500

[12] M. Pasquale, M. Coїsson, S. Perero and S.H. Lim: IEEE Trans. on Magn. Vol. 41 (2005), p.3508

[13] M. Munakata, M. Motoyama, M. Yagi, T. Ito, Y. Shimada, M. Yamaguchi, and K.I. Arai: IEEE Trans. on Magn. Vol. 38 (2002), p.3147

[14] I. Kim, J. Kim, K.H. Kim, and M. Yamaguchi: IEEE Trans on Magn. Vol. 40 (2004), p.2706

[15] S. Jin, W. Zhu, R.B. van Dover, T.H. Tiefel, V. Korenivski and L.H. Chen: Appl Phys Lett. Vol. 70 (1997), p.3161

[16] S.D. Li, Z.G. Huang, J.G. Duh, M. Yamaguchi: Appl. Phys. Lett. Vol. 92 (2008), p.092501

[17] S. Couderc, B. Viala, P. Ancey, G. Bouche, and R. Pante: IEEE Trans.on Magn. Vol. 41 (2005), p.3319

DOI: 10.1109/tmag.2005.854906

[18] M. Senda and O. Ishii: IEEE Trans. on Magn. Vol. 30 (1994), p.155

[19] M. Sonehara, T. Sugiyama, T. Sato, K. Yamasawa, and Y. Miura: IEEE Trans.on Magn. Vol. 41 (2005), p.3511

[20] M. Takezawa and J. Yamasaki: IEEE Trans. on Magn. Vol. 38 (2002), p.3150

[21] P.E. Kelly, K. O'Grady and R.W. Chantrell: IEEE Trans. Magn. Vol. 25 (1989), p.3881

[22] I. Panagiotopoulos, L. Withanawasam and G.C. Hadjipanayis: J. Magn. Magn. Mater. Vol. 152 (1996), p.353

[23] E.P. Wohlfarth: J. Appl. Phys. Vol. 29 (1958), p.59