Surface Defect Inspection and Classification of Segment Magnet by Using Machine Vision Technique

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In this paper, we propose a machine vision based approach for detecting and classifying irregular low-contrast surface defects of segment magnet. The constituent material of it is ferrite which varies from silver gray to black in color .For this reason, the defects embedded in a low-contrast surface show no big different from its surrounding region, and even worse, all the surfaces and chamfers of segment magnet must be inspected. Our system is able to analyze all surfaces under inspection, to discover and classify its defects by means of image processing algorithms and support vector machine (SVM). A working prototype of the system has been built and tested to validate the proposed approach and to reproduce the difficult issues of the inspection system. The developed prototype includes three subsystems: an array of several CCD area cameras (Fig.1); a controllable roller LED light source(Fig.1); and a PC-based image processing system. The detection of the defects is performed by means of Canny edge detection, morphology and other feature extraction operations. The image processing and classification results demonstrate that the proposed method can identify surface defects effectively.

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32-35

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September 2011

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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[1] D. Brzakovic, N. Vujovic, Designing defect classification system: a case study, Pattern Recognition 29 (1996) 1401–1419.

DOI: 10.1016/0031-3203(95)00166-2

Google Scholar

[2] Yan-Hsin Tsneg, Du-Ming Tsai, Defect detection of uneven brightness in low-contrast images using basis image representation, in: Pattern Recognition 43 (2010) 1129–1141

DOI: 10.1016/j.patcog.2009.09.006

Google Scholar

[3] J.Y. Lee, S.I. Yoo, Automatic detection of region-mura defect in TFT–LCD, IEICE Transactions on Information and Systems E87-D (2004) 2371–2378.

Google Scholar

[4] S.B. Dworkin, T.J. Nye, Image processing for machine vision measurement of hot formed parts, J. Mater. Process. Technol. 174 (2006) 1–6.

DOI: 10.1016/j.jmatprotec.2004.10.019

Google Scholar

[5] V.Vapnik,The nature of Statistical Learning Theory ,Berlin,Springer,1995.

Google Scholar

[6] Hu MK. Visual pattern recognition by moments invariants. IRE Trans Inform Theory 1962;IT-8:179–87.

Google Scholar

[7] Nor Ashidi Mat Isa,M. Subhi Al-Batah. Suitable features selection for the HMLP and MLP networks to identify the shape of aggregate, in: Construction and Building Materials 22 (2008) 402–410

DOI: 10.1016/j.conbuildmat.2006.08.005

Google Scholar