New Method for Improving the Electrical Characteristics of P-N Junction Diode

Abstract:

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This paper investigates the effect of soft X-ray irradiation various energy and times on P-N junction diodes. X-ray energy irradiated on P-N junction diode with 55 and 70 keV with various time in the range 5-50 sec. After irradiations were study on the current-voltage (I-V) characteristics and capacitance-voltage (C-V) characteristics. Leakages current after irradiated by X-ray are not change, while forward current are increase about 3 orders. The change of current-voltage characteristics can analyze by many parameter such as carrier lifetime and series resistance. Capacitance-voltage characteristics after irradiation are not change. The results show that soft X-ray technique can be improving performance of the P-N junction diodes. These techniques are importance to use for improving device performance in industry work.

Info:

Periodical:

Advanced Materials Research (Volumes 378-379)

Edited by:

Brendan Gan, Yu Gan and Y. Yu

Pages:

606-609

DOI:

10.4028/www.scientific.net/AMR.378-379.606

Citation:

I. Srithanachai et al., "New Method for Improving the Electrical Characteristics of P-N Junction Diode", Advanced Materials Research, Vols. 378-379, pp. 606-609, 2012

Online since:

October 2011

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Price:

$35.00

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