Variation of Aging Behaviour for TM-Addition Al-Mg-Si Alloys

Article Preview

Abstract:

The transition metals such as chromium and manganese are usually added to 6000 series Al-Mg-Si alloys to control recrystallization and grain size and thus the properties of alloys. In Cr/Mn-addition alloys, Cr or Mn will expense Si to form the dispersoids as AlMnSi or AlCrSi and tend to decrease its aging effect. The aim of this work is to investigate the effect of transition metals (TMs) addition on the hardness and the microstructural features of Al-Mg-Si alloys. Al-Mg-Si alloys, which can be remarked as the quasi-binary alloys of Al-Mg2Si, are prepared with Cr or Mn addition by laboratory casting. Some other transition metals, such as Co and Ni, are also added to Al-Mg-Si alloys. The grain size of four alloys decreases with TMs addition, which consequently increases the as-quenched hardness of the alloys comparing with that of the Al-Mg2Si alloy without TMs addition. The difference between Cr/Mn-addition alloy and Co/Ni-addition alloy is that the dispersoids are formed in Co/Ni-addition alloy without expensing Si. Therefore, there is little effect on the aging effect of Si in Co/Ni-addition alloy. Keywords: transition metals, hardness, microstructural, Al-Mg2Si, dispersoids.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

88-91

Citation:

Online since:

November 2011

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] H. Tanihata, T. Sugawara, K. Matsuda and Ikeno, J. Mater. Sci. Vol. 34 (1999) p.1205.

Google Scholar

[2] K. Matsuda, K. Kido, S. Taniguchi, Y. Uetani and S. Ikeno, J. Jpn. Inst. Met. Vol. 52 (2002) p.398 (in Japanese).

Google Scholar

[3] D.E. Laughlin and W.F. Miao, Automotive Alloy II (1998) p.63.

Google Scholar

[4] S. Terai and Y. Baba, J. Jpn. Inst. Met. Vol. 13 (1963) p.336 (in Japanese).

Google Scholar

[5] K. Matsuda, T. Naoi, K. Fujii, Y. Uetani, T. Sato, A. Kamio and S. Ikeno, Mater. Sci. Eng. A, Vol. 262 (1999) p.232.

Google Scholar

[6] K. Matsuda, H. Gamada, K. Fujii, Y. Yoshida, T. Sato, A. Kamio and S. Ikeno, J. Jpn. Inst. Light Met. Vol. 47 (1997) p.493 (in Japanese).

Google Scholar

[7] K. Matsuda, S. Tada and S. Ikeno, J. Electron Microsc. Vol. 42 (1993) p.1.

Google Scholar