Effect of Neodymium Salt in the Anodization of Aluminum in Sulphuric Acid

Article Preview

Abstract:

Neodymium salt was used as additives for the first time in preparing anodic aluminum oxide (AAO) films to improve its performance. AAO films were prepared by anodization method from a 15 vol. % sulphuric acid solution containing neodymium salt; the effects of concentration of neodymium on microhardness and thickness of AAO film were researched, respectively. The effect of heat treatment temperature on structure of AAO film was researched. AAO films were characterized by XRD, EDAX and SEM techniques. The microhardness and thickness of AAO film were 377.2HV and 85μm respectively, which were higher 12.60% and 21.43% than those of the film prepared in electrolyte of nothing addition neodymium salt, respectively. The surface of AAO film was smoother and the aperture of AAO film was more uniform than those of films prepared in electrolyte of nothing addition neodymium salt. The apertures of AAO film were in 25~30nm. There was not neodymium in AAO film. AAO films were amorphous when heat treatment temperatures of AAO film were below 800°C, heat treatment temperature of AAO film were 850°C and 1000°C respectively, AAO films were γ-Al2O3 and α-Al2O3 film respectively.

You might also be interested in these eBooks

Info:

Periodical:

Advanced Materials Research (Volumes 415-417)

Pages:

1895-1898

Citation:

Online since:

December 2011

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] S. Stojadinovic, Z. Nedic, I. Belca, R. Vasilic, B. Kasalica, M. Petkovic, Lj. Zekovic: Applied Surface Science Vol.256 (2009), p.763

DOI: 10.1016/j.apsusc.2009.08.056

Google Scholar

[2] H.S. Kim, D.H. Kim, W. Lee, S.J. Cho, J.H. Hahn, H.S. Ahn: Surface & Coatings Technology Vol.205 (2010), p.1431

Google Scholar

[3] S. Stojadinovic, R. Vasilic, Z. Nedic, B. Kasalica, I. Belca, Lj. Zekovic: Thin Solid Films Vol.519 (2011), p.3516

DOI: 10.1016/j.tsf.2011.01.188

Google Scholar

[4] X.Y. Han, W.Z. Shen: Journal of Electroanalytical Chemistry Vol.655 (2011), p.56

Google Scholar

[5] C.R. Martin: Science Vol.266 (1994), p.(1961)

Google Scholar

[6] J.P. O'Sullivan, G.C. Wood: Proc. R. Soc. Lond. A Vol.317 (1970), p.511

Google Scholar

[7] H. Masuda, M. Ohya, H. Asoh, M. Nakao, M. Nohtomi, T. Tamamura: Jpn. J. Appl. Phys. Part 2: Lett. Vol.38 (1999), p.1403

DOI: 10.1143/jjap.38.l1403

Google Scholar

[8] H. Masuda, K. Fukuda: Science Vol.268 (1995), p.1466 [8] X.Z. Liu, X. Li, A.B. Yu, W.J. Huang: Journal of Rare Earths Vol.27 (2009), p.480

Google Scholar

[9] X.Z. Liu, X. Li, A.B. Yu, W.J. Huang: Journal of Rare Earths Vol.27 (2009), p.480

Google Scholar