Growth of Cu2ZnSnS4 Thin Films by Sulfurization of Co-Sputtered Metallic Precursors

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Abstract:

CZTS thin films are fabricated by sulfurizing co-sputtered metallic precursor CuZnSn layers under H2S atmosphere. The precursor layers are Cu-poor, Zn-rich deposited and the fabricated films are about 2 µm in thickness. A closed-tube process is preferred with regard to its producing large closely pack grains with smooth surface. XRD and Raman confirm the CZTS structure and the impurities on the surface are removed after suitable chemistry treatments. The band gap of the CZTS is determined to be 1.48 eV by extrapolation. Some more CZTS films are product with slightly changed parameters, sulfurization time, temperature and concentration of H2S, respectively. It is supposed that beside sulfurization time, the temperature could be more significant than concentration of H2S in the closed system.

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Advanced Materials Research (Volumes 418-420)

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67-71

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December 2011

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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