Automated Debugging of Resistance Inflexion of OCXO

Jian Ping Ma; Bing Wang

doi:10.4028/www.scientific.net/AMR.433-440.5601

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 433-440Automated Debugging of Resistance Inflexion of...

Automated Debugging of Resistance Inflexion of OCXO

Abstract:

This paper presents a method of automated testing inflexion of OCXO by computer. It has been greatly reduced the debugging process and production time of OCXO through the configuration consisted by computer software and AVR single chip designing. All the advantages mentioned above contribute to the mass production of OCXO

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Periodical:

Advanced Materials Research (Volumes 433-440)

Pages:

5601-5606

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.433-440.5601

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Online since:

January 2012

Authors:

Jian Ping Ma, Bing Wang

Keywords:

Inflexion, Micro Controller Unit (MCU), OCXO, Temperature-Frequency Charcteristic, VC++

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References

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