Summarization on the Techniques of Testing Electronical System

Min Jie Du; Jin Yan Ai; Li Min Liu; Sai Zhu

doi:10.4028/www.scientific.net/AMR.433-440.6437

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 433-440Summarization on the Techniques of Testing...

Summarization on the Techniques of Testing Electronical System

Abstract:

With the fast development of electronic industry,the techniques of testing electronical system have varied from traditional functional test to structured test accordingly.The principel of functional test is presented in this paper and the representative techniques of structured test, as in-circuit test(ICT),boundary-scan test(BST),build-in self-test(BIST) and scan-path test,are explored subsequently.Finally,the developmenting trends in the future are looked forward to.

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Periodical:

Advanced Materials Research (Volumes 433-440)

Pages:

6437-6440

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.433-440.6437

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Online since:

January 2012

Authors:

Min Jie Du, Jin Yan Ai, Li Min Liu, Sai Zhu

Keywords:

BIST, Boundary-Scan Test, Functional Test, ICT, Scan-Path, Structured Test

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