System of Measuring the Sub-Pixel Edge of Linear CCD Based on Multi-Scale Transform

Abstract:

In order to improve the precision, speed, integration and reliability of the linear CCD system, a multi-scale compress derivation edge detection method of one-dimension image based on wavelet multi-scale transform is presented in this paper. The inspecting system of defects in based on CCD obtains signals of defects in with irradiation of parallel light by using linear array CCD control circuit. The defect signals were collected and transferred by using virtual oscillograph DSO-2902, and the defect signals were analyzed and processed by using computer. Based on it, Before the CCD signal entered the edge detecting system, it had been filtered by filter. Utilizing the characteristic that the grads of grey scale breaks at the edge of picture, the pixel edge of picture was detected by the algorithm which can be used to detect the edge of picture automatically. multi-scale transform used to detect the sub-pixel edge of picture. This method which is more accurate than former single threshold level comparison method can enhance edge and remove noise effectively.

• Periodical: Advanced Materials Research (Volumes 433-440)
• Pages: 6503-6508
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.433-440.6503
• Online since: January 2012
• Authors: Yu Mei Wang, Guo Sheng Xu
• Keywords: CCD, Edge Detection, Multi-Scale Transform, Sub-Pixel, Wavelet Transform (WT)

References

[1] G. S. XU. RHEOTENS Detection and Control System Based on Virtual Instrument Technology, Instrument Technique and Sensor, No. 5, 2008, pp.107-109.

[2] H. Zhao, D. T. Tu. Holograph Sizing of Contaminants in XLPE Cables[J]. IEEE Trans on EI, Vol. 4, 1991, p.217~221.

[3] G. S. XU. The Study on Real-time Data Processing Based on CCD Scanning and Detecting Device on FPGA [C]. 2009 IEEE International Conference on Intelligent Computing and Intelligent Systems., No. 2, 2009, pp.81-84.

DOI: 10.1109/icicisys.2009.5358238

[4] Y. Yoshito, M. Horoshi and A. Shiro, Binocular Robot Vision System with Shape Recognition. International Conference on Control, Automation and Systems, Korea, 2007, pp.2299-2301.

DOI: 10.1109/iccas.2007.4406743

[5] Scholz J. Investigations on Fabrics Coated with Precious Metals Using Magnetron Sputter Technique with Regard to Their Antimicrobial Properties [J]. Surface and Coatings Technology, Vol. 192, 2005, pp.252-256.

DOI: 10.1016/j.surfcoat.2004.05.036

[6] H. Zhao, Y. Liu, C. L. Li. XLPE insulation compound purity evaluation based on contam inant particlemapping technology, Chinese Journal of Scientific Instrumen, Vol 29, May. 2008, pp.1035-1039.

[7] C. Bradley, Automated Surface Roughness Measurement, The International Journal of Advanced Manufacturing Technology, Vol. 9, No. 16, pp.668-674, Dec. (2000).

DOI: 10.1007/s001700070037

[8] G. S. XU. Sub-pixel Edge Detection Based on Curve Fitting [C]. The Second International Conference on Information and Computing Science, No. 2, 2009, pp.373-375.

DOI: 10.1109/icic.2009.205

[9] H. M. Ahmed, R. E. Gabr and M. Kadahy, et al, A New Method for Data Acquisition and Image Reconstruction in Parallel Magnetic Resonance Imaging". Proceedings of the 2008 IEEE, CIBEC, 08, No. 9, pp.1-2, Dec. (2008).

DOI: 10.1109/cibec.2008.4786092

[10] G. S. XU. Linear Array CCD Image Sub-pixel Edge Detection Based on Wavelet Transform[C]. The Second International Conference on Information and Computing Science, No. 2, 2009, pp.207-210.

DOI: 10.1109/icic.2009.160

[11] Z. A. Yanuar, A. Hussein and H. Masayuki, Partial Discharge Characteristics of XLPE Cable Joint and Interfacial Phenomena with Artificial,. The 2nd IEEE International Conference on Power and Energy, Malaysia, pp.1581-1523, Dec. (2008).

DOI: 10.1109/pecon.2008.4762721