Electrochromic and Electrochemical Properties of Nickel Oxide Thin Films Prepared by a Modified Sol-Gel Method

X.H. Xia; J.P. Tu; J. Zhang; X.L. Wang

doi:10.4028/www.scientific.net/AMR.47-50.625

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 47-50Electrochromic and Electrochemical Properties of...

Electrochromic and Electrochemical Properties of Nickel Oxide Thin Films Prepared by a Modified Sol-Gel Method

Abstract:

NiO thin films were prepared on ITO glass by a modified sol-gel method in combination with a following annealing process. The XRD results show that the film annealed at 280 °C is amorphous, while the films annealed at and above 300 °C are cubic NiO phase. The electrochromic performances of the annealed films were characterized by means of UV–vis spectroscopy and cyclic voltammetry (CV) measurements. The film annealed at 280 °C exhibits a noticeable electrochromism with a variation of transmittance up to 76 % at 550 nm. The cyclic voltammetry (CV) measurements reveal that the film annealed at higher temperature has better electrochemical reversibility.