Electrochromic and Electrochemical Properties of Nickel Oxide Thin Films Prepared by a Modified Sol-Gel Method

Abstract:

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NiO thin films were prepared on ITO glass by a modified sol-gel method in combination with a following annealing process. The XRD results show that the film annealed at 280 °C is amorphous, while the films annealed at and above 300 °C are cubic NiO phase. The electrochromic performances of the annealed films were characterized by means of UV–vis spectroscopy and cyclic voltammetry (CV) measurements. The film annealed at 280 °C exhibits a noticeable electrochromism with a variation of transmittance up to 76 % at 550 nm. The cyclic voltammetry (CV) measurements reveal that the film annealed at higher temperature has better electrochemical reversibility.

Info:

Periodical:

Advanced Materials Research (Volumes 47-50)

Edited by:

Alan K.T. Lau, J. Lu, Vijay K. Varadan, F.K. Chang, J.P. Tu and P.M. Lam

Pages:

625-629

DOI:

10.4028/www.scientific.net/AMR.47-50.625

Citation:

X.H. Xia et al., "Electrochromic and Electrochemical Properties of Nickel Oxide Thin Films Prepared by a Modified Sol-Gel Method", Advanced Materials Research, Vols. 47-50, pp. 625-629, 2008

Online since:

June 2008

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$35.00

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