Electrochromic and Electrochemical Properties of Nickel Oxide Thin Films Prepared by a Modified Sol-Gel Method
NiO thin films were prepared on ITO glass by a modified sol-gel method in combination with a following annealing process. The XRD results show that the film annealed at 280 °C is amorphous, while the films annealed at and above 300 °C are cubic NiO phase. The electrochromic performances of the annealed films were characterized by means of UV–vis spectroscopy and cyclic voltammetry (CV) measurements. The film annealed at 280 °C exhibits a noticeable electrochromism with a variation of transmittance up to 76 % at 550 nm. The cyclic voltammetry (CV) measurements reveal that the film annealed at higher temperature has better electrochemical reversibility.
Alan K.T. Lau, J. Lu, Vijay K. Varadan, F.K. Chang, J.P. Tu and P.M. Lam
X.H. Xia et al., "Electrochromic and Electrochemical Properties of Nickel Oxide Thin Films Prepared by a Modified Sol-Gel Method", Advanced Materials Research, Vols. 47-50, pp. 625-629, 2008