Comparison between a Laser Micrometer and a Touch Trigger Probe for Workpiece Measurement on a CNC Lathe

Article Preview

Abstract:

The current requirements for an efficient dimensional inspection of manufactured parts have lead to development of different in process and on-machine measurement (OMM) techniques. Touch trigger probes (TTP) are the most common technologies utilized, inspired on contact probes used on coordinate measuring machines (CMMs). The on-machine accuracy of TTPs depends upon precision of the tool-machine control as well as upon the procedure for TTP presetting. Taking this into account, a different OMM technique is considered in this work, which consists on a laser micrometer (LM) that is commonly used for in-process measurement of continuous products. The behaviour of TTP and LM is analysed and discussed in terms of repeatability and reproducibility. Results obtained by both techniques are compared each other by measuring a cylindrical workpiece and by checking the results with those obtained on a CMM.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

49-54

Citation:

Online since:

April 2012

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] M . Del Guerra and R.T. Coelho: J. Mat. Proc. Tech. 179 (1-3), (2006), pp.117-123.

Google Scholar

[2] G. Valiño, Y. Prado, J.C. Rico, B.J. Álvarez, in: Proc. ETFA, Palma de Mallorca (Spain), (2009).

Google Scholar

[3] X. Li: Int. J. Adv. Manuf. Technol. Vol. 17 (2001), pp.649-653.

Google Scholar

[4] V.A. Ostafiev and P.K. Venuvinod: IMECE-97. ASME. (1997).

Google Scholar

[5] T. Yandayan and M. Burdekin, in: Proc. of IMEchE. part B.J. Of Eng. Manuf. 212 (1998), p.183.

Google Scholar

[6] M. Shiraishi: Annals of CIRP. Vol. 28 (1979), p.333.

Google Scholar

[7] O. Sasaki, K. Hashimoto, Y. Fujimori and T. Suzuki, in: Proc. of SPIE. 4416 (2001), p.35.

Google Scholar