A Method of Film Retroreflection Index Calculated by Reflectance Spectrum

Yong Yang; Chuan Zheng Zhu; Yuan Yuan Bai; Wei Li

doi:10.4028/www.scientific.net/AMR.503-504.1284

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 503-504A Method of Film Retroreflection Index Calculated...

A Method of Film Retroreflection Index Calculated by Reflectance Spectrum

Abstract:

Retroreflective film are used widely in traffic and municipal field as information carrier, the retroreflection index is considered the most important parameter, test methods of this parameter including absolute and relative method, traditional instruments are consisted of light source, photometric detector, angle adjust device, etc. The complex structure of instrument add the uncertainty component, so reflectance spectrum is used to calculated the film retroreflection index, this method would improve the testament accuracy and provide more light sources choices without structure adjustment.

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Periodical:

Advanced Materials Research (Volumes 503-504)

Pages:

1284-1287

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.503-504.1284

Citation:

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Online since:

April 2012

Authors:

Yong Yang, Chuan Zheng Zhu, Yuan Yuan Bai, Wei Li

Keywords:

Light Source, Reflectance Spectrum, Retroreflection Index, Uncertainty Component

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References

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