Research on Storage Life of Electronic Equipment Based on Goodness of Fit Test Method

Abstract:

The test of distribution is to infer that whether the life of produce can satisfy the distribution chosen by a simple analysis of the test data or the alive using data . Based on the principle of fit goodness test and the Pearson test method , which is one of a common distribution test methods, a kind of special F test method is researched for the situation that the product life obeys to exponential distribution. With that method, the distribution of the storage life of electronic devices is researched.

• Periodical: Advanced Materials Research (Volumes 605-607)
• Pages: 85-87
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.605-607.85
• Online since: December 2012
• Authors: Jun Sheng Wang, Jin Huang Wu, Yi Dong Wang, Jun Wei Lei
• Keywords: Electronic Device, Fit Test, Goodness, Storage Life

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