Research Development of Solder Materials and its Intermetallic Compound (IMC) Study

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Nowadays, the formation and the subsequent growth of the intermetallic compounds (IMCs) and the development of new lead-free solder systems is a major issue in soldering. The excessive growth formation of intermetallic compounds will increase the brittleness of solder joints and detrimentally affects its mechanical properties. This paper reviews the latest fabrication method for solder materials and the literatures of bulk IMCs study in most solder materials by other researchers. Explanation on solder fabrication by using powder metallurgy method to produce solder materials and IMCs study were explained in detail in this paper.

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797-801

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December 2012

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] J. Shen, Y.C. Chan. Microelectronics Reliability Vol. 49 (2009), pp.223-234.

Google Scholar

[2] S.M.L. Nai, J. Wei and M. Gupta. Thin Solid Films, Vol. 504 (2006), pp.401-404.

Google Scholar

[3] M.A.A. Mohd Salleh, A.M.A. B Mustafa, H. Kamarudin, M.H. Zan@Hazizi, and S. Flora. Physics Procedia, Vol. 22 (2011), pp.299-304.

Google Scholar

[4] M.A.A. Mohd Salleh, M.H. Zan@Hazizi, H. Kamarudin, A.A. Zainal, and R.A. Khairel. Advanced Materials Research, Vol. 277 (2011), pp.106-111.

Google Scholar

[5] J. Hu, A. Hu, M. Li, and D. Mao. Materials Characterization Vol. 61(2010), pp.355-361.

Google Scholar

[6] F.J. Wang, Z.S. Yu, and K. Qi. Journal of Alloys and Compounds, Vol. 438 (2007), pp.110-115.

Google Scholar

[7] W. Moo-Chin, Y. Shan-Pu, C. Tao-Chih, and H. Min-Hsiung. J Alloy & Compound, Vol. 389 (2005), pp.133-139.

Google Scholar

[8] M.S. Suh, C.J. Park, and H.S. Kwon. Materials Chemistry and Physics, Vol. 110 (2008), pp.95-99.

Google Scholar

[9] A. Sharif and Y.C. Chan. Thin Solid Films, Vol. 504 (2006), pp.431-435.

Google Scholar

[10] Q. Zeng, J. Guo, X. Gu, X. Zhao, and X. Liu. J. Mater. Sci. Tech, Vol. 26(2) (2010), pp.156-162.

Google Scholar

[11] H.F. Zou, Z.F. Zhang. J. of Alloys&Compounds. Vol. 469 (2009), pp.207-214.

Google Scholar

[12] R. Mayapan, and Z.A. Ahmad. Intermetallics, Vol. 18 (2010), pp.730-735.

Google Scholar

[13] H.L.J. Pang, K.H. Tan, X.Q. Shi, and Z.P. Wang, Materials Science and Engineering, Vol. A307(2001), pp.42-50.

Google Scholar

[14] Satyanarayan, K. N. Prabhu. Adv in Colloid & Interface Science, Vol. 166(2011), pp.87-118.

Google Scholar

[15] T. Chellaih, G. Kumar, K.N. Prabhu. Material & Design, Vol. 28 (2007), pp.1006-1011.

Google Scholar

[16] P. Sun, C. Andersson, X. Wei, Z. Cheng, D. Shangguan, and J. Liu. Material Science & Engineering, Vol. B135 (2006), pp.134-140.

Google Scholar

[17] S. Katsuaki S. Lead-free soldering in electronics. (New York: Marcel Dekker; 2004).

Google Scholar

[18] M.J. Rizvi, C. Bailey, Y.C. Chan, M.N. Islam, and H. Lu. Journal of Alloys and Compounds, Vol. 438 (2007), p.122–128.

Google Scholar

[19] L. C Tsao, M.W. Wu and S.Y. Chang. Journal Material Science. (2011).

Google Scholar

[20] K. Ja-Myeong, J. Seung-Boo. Microelectronics Reliability, Vol. 47 (2007), p.2169–2178.

Google Scholar

[21] A.S.M.A. Haseeb, and T.S. Leng. Intermetallics, Vol. 19 (2011), pp.707-712.

Google Scholar

[22] D.Q. Yu, C.M.L. Wu, C.M.T. Law, L. Wang, and J.K.L. Lai. Journal of Alloys and Compounds Vol. 392(2005), p.192–199.

Google Scholar