Effect of Slit Width on the Results of Small-Angle X-Ray Diffraction

Hua Yong Zhang; Xiao Jian Liu

doi:10.4028/www.scientific.net/AMR.630.331

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 630Effect of Slit Width on the Results of Small-Angle...

Effect of Slit Width on the Results of Small-Angle X-Ray Diffraction

Abstract:

X-ray diffraction analysis is a convenient and important route to investigate crystalline materials. With mesoporous materials, Al-SBA-15 as target, the effects of scatter slit, soller slit and receiving slit of Bruker D8 ADVANCE diffractometer on the small-angle diffraction pattern based on information, such as the background intensity, peak height, intensity and full width at half maximum, which provide the evidence for slits selection.

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Periodical:

Advanced Materials Research (Volume 630)

Pages:

331-334

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.630.331

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Online since:

December 2012

Authors:

Hua Yong Zhang, Xiao Jian Liu

Keywords:

Diffraction Patterns, Slit Width, X-Ray Diffraction (XRD)

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