A Design for the Large-Angle and Wide Wavelength Antireflective of Film

Abstract:

The idea of non-uniform film was applied: the multilayer uniform films could be equivalent to a non-uniform film layer so that the non-uniform film system could be converted to the uniform film system and the index of refraction of each layer could be gotten by the equivalent method. The relevant design and reasonable optimization for the film system were conducted through computer so as to get a film system whose transmittance is greater than 95% with the incidence angle within 520-640 and wavelength at 420-670nm.

• Periodical: Advanced Materials Research (Volumes 634-638)
• Pages: 2605-2608
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.634-638.2605
• Online since: January 2013
• Authors: Fu Yang, Bing Han, Jin Feng Wang, Xu Dong Meng
• Keywords: Antireflective Films, Index of Refraction, Reflectivity, Transmittance

References

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DOI: 10.1364/ao.45.001544

[4] Uwe B. Schallenberg: Antireflection design concepts with equivalent layers, APPLIED OPTICS, 2006(3), pp.1507-1514.

DOI: 10.1364/ao.45.001507

[5] Uwe B. Schallenberg: Antireflection design concepts with equivalent layers, APPLIED OPTICS, 2006(3), pp.1507-1514.

DOI: 10.1364/ao.45.001507