Efficient Phase Unwrapping Algorithm Based on Fringe Projection Applying Reliability-Guided Technique

Wen Guo Li; Shao Jun Duan

doi:10.4028/www.scientific.net/AMR.662.975

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 662Efficient Phase Unwrapping Algorithm Based on...

Efficient Phase Unwrapping Algorithm Based on Fringe Projection Applying Reliability-Guided Technique

Abstract:

We present a new method to define the reliability of pixel and path of phase unwrapping. The reliability function is calculated based on modulation, second difference of wrapped phase, and second differnce of modulation, and then we present the concept of smoothness of path, the reliability of path is calculated based on reliability of pixel and smoothness of path. Experiment results validate the correctness of our proposed algorithm.

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Periodical:

Advanced Materials Research (Volume 662)

Pages:

975-978

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.662.975

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Online since:

February 2013

Authors:

Wen Guo Li, Shao Jun Duan

Keywords:

Fringe Projection, Optical Measurement, Path Reliability, Phase Unwrapping, Reliability-Guided

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