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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 677Spectral-Type Probe with λ/40 Resolution for...

Spectral-Type Probe with λ/40 Resolution for Near-Field Optical Microscopy Systems

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Abstract:

We studied numerically and experimentally the ability to develop a new probe based on fiber Fabry-Perot interferometer with an evanescent light source protruding directly toward the sample. It was shown that such probe provides a spatial resolution of no worse than ~λ/40 for λ=1550 nm. The fabrication process of the probe is described in detail.

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Periodical:

Advanced Materials Research (Volume 677)

Pages:

373-378

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.677.373

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Online since:

March 2013

Authors:

Y.N. Kulchin, Oleg B. Vitrik, Aleksandr A. Kuchmizhak

Keywords:

Fiber Fabry-Perot Interferometer, Near-Field Optical Microscopy, Subwavelength Aperture

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] D. W. Pohl and W. D. M. Lanz, Appl. Phys. Lett. 44, 651 (1984).

[2] F. de Lange, A. Cambi, R. Huijbens, B. de Bakker, W. Rensen, M. Garcia-Parajo, N. van Hulst, and C. G. Figdor, J. Cell. Sci. 114, 4153 (2001).

DOI: 10.1242/jcs.114.23.4153

[3] L. K. Kapkiai, D. Moore-Nichols, J. Carnell, and J. R. Krogmeier, Appl. Phys. Lett. 84, 3750 (2004).

DOI: 10.1063/1.1737464

[4] H. G. Frey, S. Witt, K. Felderer, and R. Guckenberger, Phys. Rev. Lett. 93, 200801 (2004).

[5] K. Matsuda, T. Saiki, S. Nomura, M. Mihara, Y. Aoyagi, S. V. Nair and T. Takagahara, Phys. Rev. Lett. 91, 177401 (2003).

DOI: 10.1103/physrevlett.91.177401

[6] Sendur, C. Peng and W. Challener, Phys. Rev. Lett. 94, 043901 (2005).

[7] J.B. Leen, P. Hansen, Y. Cheng, A. Gibby, L. Hesselink, Appl. Phys. Lett. 97, 073111 (2010).

DOI: 10.1063/1.3474801

[8] В. Hecht, В. Sick, U. P. Wild, V. Deckert, R. Zenobi, O.J.F. Martin and D.W. Pohl, J. Chem. Phys. 112, 7761 (2000).

[9] T. Yatsui, M. Kourogi and M. Ohtsu, Appl. Phys. Lett. 73, 2090 (1998).

[10] Yu.N. Kulchin, O.B. Vitrik, A.V. Bezverbniy, E.V. Pustovalov, A.A. Kuchmizhak, A.V. Nepomnyashchii, Crystallography Reports. 56, 866 (2011).

[11] A. Taflove and S.C. Hagness Computational Electrodynamics: The Finite-Difference Time-Domain Method (Artech House, inc. 2000).

[12] P.B. Johnson and R.W. Christy, Phys. Rev. B. 6, 4370 (1972).

[13] T. Pangaribuan, K. Yamada, Sh. Jiang, H. Ohsawa and M. Ohtsu, Jpn. J. Appl. Phys. 31, 1302 (1992).