Structural and Optical Properties of Thermally Evaporated BiSb2S3 Thin Films

K. Kandaswamy; Panneerselvam  Chirstopher Selvin; B. Nalini; I. Mohamed Abdulla; K.P. Abhilash

doi:10.4028/www.scientific.net/AMR.678.123

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 678Structural and Optical Properties of Thermally...

Structural and Optical Properties of Thermally Evaporated BiSb₂S₃ Thin Films

Abstract:

Thin films of Bi_1.5(Sb₂S₃)_0.5 of different thickness were deposited on glass substrate by vacuum thermal evaporation method and annealed at different temperature. The elemental compositions of the films were confirmed by energy dispersive X-ray analysis (EDAX). The prepared films were structurally and morphologically characterized by X-ray diffraction (XRD) and microscopic (SEM & AFM) techniques respectively. It has been confirmed that the films possess polycrystalline nature with orthorhombic phase and the grain size of the films vary from 27.92 to 81.37 nm. The observed bandgap energies (varying from 1.787eV to 1.963 eV) of the films and its temperature dependence were estimated from optical absorption measurements.

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Advanced Materials Research (Volume 678)

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123-130

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.678.123

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Online since:

March 2013

Authors:

K. Kandaswamy, Panneerselvam Chirstopher Selvin, B. Nalini, I. Mohamed Abdulla, K.P. Abhilash

Keywords:

Bandgap, Bismuth Antimony Trisulfide Nano Films, EDAX, Optical Absorption, X-Ray Diffraction (XRD)

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