Structural and Optical Properties of Thermally Evaporated CdTe Film

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Abstract. Cadmium Telluride (CdTe) films were thermally evaporated on to glass substrates at room temperature. By varying the amount of source material, thin films of thickness ranging from 90 nm – 635 nm have been prepared. Film of thickness 200 nm was annealed to 400°C for different durations of time and also subjected to alternate heating - cooling cycle. X-ray diffraction study was carried out to study the effect of film thickness, annealing duration and alternate heating-cooling cycle on the structural properties of the films. The transmittance spectra recorded using a UV-Vis-NIR spectrophotometer was used to study the change in optical properties of the films with respect to film thickness, annealing duration and alternate heating-cooling cycle.

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131-135

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March 2013

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© 2013 Trans Tech Publications Ltd. All Rights Reserved

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[1] Wu, X., Keane, J.C., DeHart, C., Albin, D.S., Duda, A., Gessert, T.A., Asher, S., Levi, D.H., Scheldon, P., 2001. In: Proc. of the 17th European Photovoltaic Solar Energy Conference, Munich, Germany, p.995–999.

Google Scholar

[2] G.S. Sanyal, A. Mondal, K.C. Mandal, B. Ghosh, H. Saha and M.K. Mukherjee, Solar Energy Materials 20 (1990) 395-404.

DOI: 10.1016/0165-1633(90)90031-u

Google Scholar

[3] S. Lalitha, R. Sathyamoorthy, S. Senthilarasu, A. Subbarayan, Solar Energy materials & Solar Cells 90 (2006) 694-703.

DOI: 10.1016/j.solmat.2005.04.006

Google Scholar

[4] E. Bacaksiz, B.M. Basol, M. Altunbas, V. Novruzov, E. Yanmaz, S. Nezir, Thin Solid Films 515 (2007) 3079-3084.

DOI: 10.1016/j.tsf.2006.08.026

Google Scholar

[5] A.A.J. Al-Douri, F.Y. Al-Shakily, M.F.A. Alias, and A.A. Alnajjar, Advances in Condensed Matter Physics (2010) 1-5.

DOI: 10.1155/2010/947684

Google Scholar

[6] Sukhvir Singh, Rajeev Kumar, K.N. Sood, Thin Solid Films 519 9 (2010) 1078-1081.

Google Scholar

[7] Eric Lifshin, X-ray Characterization of Materials, Wiley-VCH, NY, (1999) 37.

Google Scholar

[8] G.B. Williamson, R.C. Smallman, Philos. Mag. 1 (1956) 34.

Google Scholar

[9] JCPDS file no. 75-2086.

Google Scholar

[10] M.R. Ebeide, M.F. Ahmed, A.A. Ramadan and K. Abdel-Hady, Egypt. J. Solids, 28 (2005) 231-237.

Google Scholar

[11] Jodl Pantoja Enriquez, Xavier Mathew, Solar Energ Materials and Solar Cells 81 (2004) 363-369.

Google Scholar

[12] J.J. Pankove, Optical Processes in Semiconductors, Prentice-Hall, Englewood Cliffs, NJ,1971.

Google Scholar

[13] E.R. Shaaban et al., J. of Alloys and Compounds, 482 (2009) 400.

Google Scholar

[14] A.A. Al-Ghamdi et al., Optics & Laser Technology 42 (2010) 1181.

Google Scholar