Study on the ZnO-B2O3-SiO2 Glass-Ceramic with DTA, XRD and SEM

Mei Li; Ming Wang; Mi Tang Wang; Mao Rong Hao; Zhao Gang Liu; Yan Hong Hu; Peng Yue

doi:10.4028/www.scientific.net/AMR.683.42

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 683Study on the ZnO-B2O3-SiO2 Glass-Ceramic with DTA,...

Study on the ZnO-B₂O₃-SiO₂ Glass-Ceramic with DTA, XRD and SEM

Abstract:

The ZnO-B2O3-SiO2 base glass was prepared with high temperature melting method. The base glass powder was investigated by differential thermal analysis (DTA) and the glass-ceramic was investigated by X-ray diffraction (XRD) analysis and scanning electron microscope (SEM). The results indicated that the structure adjustment of the base glass appeared around 595°C and the exothermic peaks turned up around 740°C and 860°C in the DTA testing. But the strength of the structure adjustment and the exothermic peaks was weak. The XRD results showed that the non-crystal glass was amorphous form without diffraction peaks appearing. The crystallization glass obviously contained crystals, which were more amount of ZnAl2O4 crystal and a small amount of NaAlSiO4 crystal. Through the SEM, the surface morphology of the glass-ceramic showed that the amount of the crystal was dense.

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Periodical:

Advanced Materials Research (Volume 683)

Pages:

42-45

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.683.42

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Online since:

April 2013

Authors:

Mei Li, Ming Wang, Mi Tang Wang, Mao Rong Hao, Zhao Gang Liu, Yan Hong Hu, Peng Yue

Keywords:

DTA, Glass-Ceramic, SEM, X-Ray Diffraction (XRD), ZnO-B₂O₃-SiO₂

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